| 摘要 |
An apparatus for measuring an optical anisotropy of an object to be examined, such as a liquid crystal, based on an interaction of an evanescent wave occurring during total reflection of a beam with the object is disclosed. The apparatus includes a transparent member having a curved surface and a flat surface for mounting an object to be examined thereon; a light source disposed opposite to a first region of the curved surface of the transparent member so as to emit a beam incident through the first region and the transparent member to an outer surface of the object; a polarizer disposed on the emission side of the light source; an incident optical system disposed between the light source and the first region of the curved surface; a photodetector disposed opposite to a second region of the curved surface of the transparent member so as to detect a beam emitted from the light source, totally reflected at a proximity of the outer surface of the object and incident thereto through the second region; and an analyzer disposed between the photodetector and the second region of the curved surface. The object to be examined may be mounted movably on the flat surface of the transparent member via a liquid having a refractive index almost equal to that of the transparent member. <IMAGE> |
