发明名称 Apparatus and method for developing resist coated on a substrate
摘要 A developing apparatus comprising a spin chuck for rotating a wafer while keeping the wafer substantially horizontal with a resist-coated surface up, a nozzle for supplying developer, from above and obliquely, to the resist-coated surface of the wafer on the sign chuck, a source for supplying the developer to the nozzle, a cup arranged enclosing a peripheral portion of the wafer on the spin chuck and having a drain passage through which the developer supplied to the wafer is drained, and a belt drive mechanism for moving the nozzle in a horizontal plane to discharge the developer to the wafer in such a direction that follows the wafer rotating.
申请公布号 US5625433(A) 申请公布日期 1997.04.29
申请号 US19950535895 申请日期 1995.09.28
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON KYUSHU LIMITED 发明人 INADA, HIROICHI;TSUNEMATSU, KUNIE
分类号 B05D1/40;B05C5/00;B05C11/08;G03F7/20;G03F7/30;H01L21/027;(IPC1-7):G03D5/00;G03D3/02 主分类号 B05D1/40
代理机构 代理人
主权项
地址