发明名称 SUBSTRATE TREATING DEVICE AND PARTICLE ELIMINATING METHOD
摘要 PROBLEM TO BE SOLVED: To improve productivity by positively eliminating particles in a semiconductor substrate treating device. SOLUTION: In a substrate treating device with a substrate treatment room which can be divided into single rooms, a substrate treatment room 14 has a flow-in port 141a of inactive gas for eliminating particles and an exhaust port 144b and a pressure controller 21-3 for controlling the pressure in the treatment room between the exhaust port 144b and an exhaust device connected to the exhaust port and the pressure controller 21-3 maintains the flow of the inactive gas at a time zone excluding a required substrate treatment process in the substrate treatment room.
申请公布号 JPH09102524(A) 申请公布日期 1997.04.15
申请号 JP19950256200 申请日期 1995.10.03
申请人 FUJITSU LTD 发明人 SUZUKI MOTOYA
分类号 G01N21/88;B23Q11/00;G01N21/94;G01N21/956;H01L21/02;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 G01N21/88
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