Device transfer mechanism for IC test handler

摘要

A device transfer mechanism of an IC test handler is disclosed which is low cost, requires less space and has an inexpensive and simple structure. The device transfer mechanism can readily change a soak time for applying predetermined temperature to the devices to be tested according to the device test time. A device transfer mechanism includes a circular-orbit rotation table with multiple pockets that stores the devices by a unit of n pieces on the disk-shaped rotation table, and at least three arms each of which has a contact arm with a suction section that sucks the devices by a unit of n pieces at the tip of each arm. A rotation storage arm can be additionally provided to transfer the devices by arranging multiple arms with pockets that store devices 71 by a unit of n pieces at the tip of each arm. In a further aspect of the transfer mechanism, pockets that store the devices by a unit of n pieces at the tip of each arm can be disposed along with a reciprocal storage arm that transfers the devices in a reciprocal movement to a storage buffer section.