| 摘要 |
A nonvolatile memory device having a control gate laid over a floating gate via an interlayer insulating layer, wherein the side portions of the floating gate and the control gate have a side wall insulating film doped with phosphorus, whereby the retention of the charges stored at the floating gate is improved, and a process for production of a nonvolatile memory device comprising forming a gate insulating film, a floating gate, an interlayer insulating layer, and a control gate on a semiconductor substrate, then forming a side wall insulating film doped with phosphorus on the semiconductor substrate by chemical vapor deposition and anisotropically etching the side wall insulating layer so as to form a side wall insulating film doped with phosphorus at the side portions of the floating gate and the control gate.
|
