| 摘要 |
PROBLEM TO BE SOLVED: To measure X-ray standing waves by using a general X-ray source. SOLUTION: An optical system excepting an X-ray generation source 1 (X-ray generator 2) is arranged in a thermostatic chamber 6. That is, a monochrometer 3, a sample rotary stage 4, a first crystal rotary stage 5, a Brag reflection detector 7 and a semiconductor detector 9 are arranged in the thermostatic chamber 6 and the X-ray generation source 1, the X-ray generator 2 and a liquid nitrogen supply tank 12 are arranged to the outside of the thermostatic chamber 6 and cooling liquid nitrogen of the semiconductor detector 9 is supplied from the outside. |
