发明名称 Power amplification circuit
摘要 <p>Variations in the waveform of high-frequency signals amplified by a field-effect transistor (FET) in a power amplification circuit due to changes in temperature are reduced. A FET having an n-type active layer, a source electrode, a drain electrode and a gate electrode is formed on a (1 0 0)-crystal plane of a semi-insulating GaAs substrate. The FET is protected by a passivation film. The angle &thetas;, formed between the longitudinal axial direction of the gate electrode and the &lang&0 -1 -1&rang&-direction, is set at an angle of from 0 DEG to 90 DEG corresponding to the impurity concentration of the n-type active layer, in order that the temperature coefficient of the FET threshold voltage becomes substantially equal to the temperature coefficient of the gate bias voltage applied from a power supply to the gate electrode. If the angle &thetas; is set at 45 DEG , then the temperature coefficient of the FET threshold voltage becomes zero. &lt;IMAGE&gt;</p>
申请公布号 EP0762631(A2) 申请公布日期 1997.03.12
申请号 EP19960113763 申请日期 1996.08.28
申请人 MATSUSHITA ELECTRONICS CORPORATION 发明人 FURUKAWA, HIDETOSHI;UEDA, DAISUKE
分类号 H01L29/04;H01L29/423;H03F1/30;H03F3/193;(IPC1-7):H03F3/193 主分类号 H01L29/04
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