发明名称 |
Power amplification circuit |
摘要 |
<p>Variations in the waveform of high-frequency signals amplified by a field-effect transistor (FET) in a power amplification circuit due to changes in temperature are reduced. A FET having an n-type active layer, a source electrode, a drain electrode and a gate electrode is formed on a (1 0 0)-crystal plane of a semi-insulating GaAs substrate. The FET is protected by a passivation film. The angle &thetas;, formed between the longitudinal axial direction of the gate electrode and the &lang&0 -1 -1&rang&-direction, is set at an angle of from 0 DEG to 90 DEG corresponding to the impurity concentration of the n-type active layer, in order that the temperature coefficient of the FET threshold voltage becomes substantially equal to the temperature coefficient of the gate bias voltage applied from a power supply to the gate electrode. If the angle &thetas; is set at 45 DEG , then the temperature coefficient of the FET threshold voltage becomes zero. <IMAGE></p> |
申请公布号 |
EP0762631(A2) |
申请公布日期 |
1997.03.12 |
申请号 |
EP19960113763 |
申请日期 |
1996.08.28 |
申请人 |
MATSUSHITA ELECTRONICS CORPORATION |
发明人 |
FURUKAWA, HIDETOSHI;UEDA, DAISUKE |
分类号 |
H01L29/04;H01L29/423;H03F1/30;H03F3/193;(IPC1-7):H03F3/193 |
主分类号 |
H01L29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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