发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To prevent fusing by increasing heat capacity of a protecting resistance layer provided in an input/output protection circuit. SOLUTION: This semiconductor device is provided with an internal circuit and a protection circuit for protecting the internal circuit from external abnormality voltage such as static electricity, etc. A memory cell having a capacitor containing a storage node electrode 7 is formed in the internal circuit. A protecting resistance layer 9 connected to a terminal used for input or output of signal is formed in the protection circuit. And the thickness t1 of the storage node electrode 7 is equal to the thickness t3 of the protecting resistance layer 9.
申请公布号 JPH0969613(A) 申请公布日期 1997.03.11
申请号 JP19950225154 申请日期 1995.09.01
申请人 MITSUBISHI ELECTRIC CORP 发明人 HIDA YOICHI
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L23/62;H01L27/108 主分类号 H01L27/04
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