发明名称 |
Method of applying boundary test patterns |
摘要 |
A boundary scan cell including a three-state output buffer, a test data scan flip-flop for providing an input to the three-state buffer, a control data scan flip-flop for receiving a serial control data input, independent clock signals for independently clocking the test data scan flip-flop and the control data scan flip-flop, and control circuitry for controllably providing the output of the control data scan flip-flop to the three-state output driver such that the enabled state of the three-state output buffer is controlled by the output of the control data scan flip-flop, whereby the enabled state of the three-state output driver is controlled independently of the test data in the test data scan flip-flop. |
申请公布号 |
US5606565(A) |
申请公布日期 |
1997.02.25 |
申请号 |
US19950388655 |
申请日期 |
1995.02.14 |
申请人 |
HUGHES ELECTRONICS |
发明人 |
EDLER, CHRISTOPHER L.;FARWELL, WILLIAM D.;HERMAN, IAN;HOANG, TUAN M.;KEISH, BRIAN F.;MASCITELLI, ALIDA G. |
分类号 |
G01R31/317;G01R31/3185;(IPC1-7):H04B17/00 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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