发明名称 Insulated gate bipolar transistor having high breakdown voltage
摘要 <p>An insulated gate bipolar transistor having a low on-voltage and a low turn-off time is provided. P-type anode layer (11) having a low impurity concentration, preferably 1 x 10<1><6> to 1 x 10<1> 7/cm<3>, is provided on an N-type drain layer (12) that includes a pair of P-type base regions (13) having an N<+>-type source regions (14). A plurality of P<+>-type anode regions (21) are formed in the P-type anode layer (11). <IMAGE></p>
申请公布号 EP0528349(B1) 申请公布日期 1997.02.12
申请号 EP19920113743 申请日期 1992.08.12
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KUWAHARA, MASASHI
分类号 H01L29/78;H01L29/08;H01L29/739;(IPC1-7):H01L29/08 主分类号 H01L29/78
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