发明名称 SEMICONDUCTOR MANUFACTURING DEVICE AND MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and semiconductor integrated circuit device manufacturing method with which a semiconductor integrated circuit device of excellent electric characteristics can be manufactured easily. SOLUTION: A silicon oxide film forming chamber 5, in which a silicon oxide film is formed on the semiconductor region surface where the surface of a wafer 2 is exposed, is provided between a CVD chamber 6, which is a treatment chamber to treat the wafer 2, and a load lock chamber 4 where the wafer 2 is carried in and out to and from the CVD chamber in the semiconductor manufacturing device.
申请公布号 JPH0936109(A) 申请公布日期 1997.02.07
申请号 JP19950182448 申请日期 1995.07.19
申请人 HITACHI LTD;HITACHI TOKYO ELECTRON CO LTD 发明人 INOMAKI YOSHIHIRO;YATSUDA YUJI;MATSUDA YASUSHI;AOKI TADASHI
分类号 B01J19/00;H01L21/31;H01L21/316;H01L21/677;H01L21/68;(IPC1-7):H01L21/31 主分类号 B01J19/00
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