发明名称 |
SEMICONDUCTOR MANUFACTURING DEVICE AND MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and semiconductor integrated circuit device manufacturing method with which a semiconductor integrated circuit device of excellent electric characteristics can be manufactured easily. SOLUTION: A silicon oxide film forming chamber 5, in which a silicon oxide film is formed on the semiconductor region surface where the surface of a wafer 2 is exposed, is provided between a CVD chamber 6, which is a treatment chamber to treat the wafer 2, and a load lock chamber 4 where the wafer 2 is carried in and out to and from the CVD chamber in the semiconductor manufacturing device. |
申请公布号 |
JPH0936109(A) |
申请公布日期 |
1997.02.07 |
申请号 |
JP19950182448 |
申请日期 |
1995.07.19 |
申请人 |
HITACHI LTD;HITACHI TOKYO ELECTRON CO LTD |
发明人 |
INOMAKI YOSHIHIRO;YATSUDA YUJI;MATSUDA YASUSHI;AOKI TADASHI |
分类号 |
B01J19/00;H01L21/31;H01L21/316;H01L21/677;H01L21/68;(IPC1-7):H01L21/31 |
主分类号 |
B01J19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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