发明名称 Method for manufacturing a semiconductor wiring structure including a self-aligned contact hole
摘要 In a highly integrated semiconductor wiring structure having a plurality of wiring layers and a self-aligned contact hole formed therebetween, the wiring layer is formed such that a portion where a contact hole will be formed is formed to a first wiring width and a remaining portion is formed to a second wiring width being wider than the first wiring width. In the method for manufacturing such a structure, the contact hole is formed in self-alignment fashion, and thus, a short which may occur due to misalignment can be prevented.
申请公布号 US5597763(A) 申请公布日期 1997.01.28
申请号 US19950427855 申请日期 1995.04.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SIM, SANG-PIL
分类号 H01L21/3205;H01L21/768;H01L21/8234;H01L21/8242;H01L23/52;H01L23/528;H01L27/088;H01L27/10;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L21/3205
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