发明名称 Method of manufacturing a semiconductor device including bipolar and MOS transistors
摘要 An npn bipolar transistor and a p-channel MOS transistor are formed on a p-type silicon substrate. The outer base electrode of the npn bipolar transistor and the gate electrode of the p-channel MOS transistor contain a p-type impurity and are composed of films consisting of the same material. The inner and outer bases are formed in a surface region of the p-type silicon substrate. The outer base is connected to the outer base electrode. The emitter electrode of the npn bipolar transistor is formed on the inner base. A laminated film constituted by a silicon oxide film and a silicon nitride film is formed on a p-type silicon substrate at a position between the outer base electrode and the emitter electrode.
申请公布号 US5597757(A) 申请公布日期 1997.01.28
申请号 US19950503489 申请日期 1995.07.18
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MAEDA, TAKEO;MOMOSE, HIROSHI
分类号 H01L21/8249;H01L27/06;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L21/8249
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