发明名称 |
Method of manufacturing a semiconductor device including bipolar and MOS transistors |
摘要 |
An npn bipolar transistor and a p-channel MOS transistor are formed on a p-type silicon substrate. The outer base electrode of the npn bipolar transistor and the gate electrode of the p-channel MOS transistor contain a p-type impurity and are composed of films consisting of the same material. The inner and outer bases are formed in a surface region of the p-type silicon substrate. The outer base is connected to the outer base electrode. The emitter electrode of the npn bipolar transistor is formed on the inner base. A laminated film constituted by a silicon oxide film and a silicon nitride film is formed on a p-type silicon substrate at a position between the outer base electrode and the emitter electrode.
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申请公布号 |
US5597757(A) |
申请公布日期 |
1997.01.28 |
申请号 |
US19950503489 |
申请日期 |
1995.07.18 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
MAEDA, TAKEO;MOMOSE, HIROSHI |
分类号 |
H01L21/8249;H01L27/06;(IPC1-7):H01L21/70;H01L27/00 |
主分类号 |
H01L21/8249 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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