发明名称 Nonvolatile semiconductor memory device
摘要 A select MOS transistor and a data storage MOS transistor are formed in an element region. The transistor has floating-gate electrodes. The floating-gate electrodes are spaced apart above the element region and connected to each other above a field region. Only a tunnel insulating film much thinner than a gate insulating film of the transistor is placed between the floating-gate electrode and a drain region. Only the gate insulating film much thinner than the gate insulating film of the transistor is placed between the floating-gate electrode and the channel region of the transistor. In the element region, the shape of a control electrode is the same as that of the floating-gate electrodes.
申请公布号 US5596529(A) 申请公布日期 1997.01.21
申请号 US19940351185 申请日期 1994.11.30
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 NODA, JUNICHIRO;TOHYAMA, DAISUKE
分类号 H01L21/8247;H01L27/105;H01L27/115;H01L29/423;H01L29/788;(IPC1-7):G11C11/34 主分类号 H01L21/8247
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