发明名称 ATR INFRARED SPECTRUM MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To obtain an ATR infrared spectrum measuring apparatus in which an ATR crystal is protected against damage due to over tightening of a solid sample and the tightening of solid sample can be regulated easily and a tightening force can be applied uniformly. SOLUTION: The ATR infrared spectrum measuring apparatus comprises a body 1A, a base plate 2 fixed detachably onto the body 1A, an ATR crystal 4 secured detachably through a stop plate 6 to a mounting face 5 having high surface accuracy provided on the base plate 2, a holder 10 moving up and down with respect to a solid sample 8 mounted on the ATR crystal 4, a stopper plate 14 for urging the holder 10 downward through a repellent member 13, and a member 17 for moving the stopper plate 14 up and down.
申请公布号 JPH0921747(A) 申请公布日期 1997.01.21
申请号 JP19950196210 申请日期 1995.07.08
申请人 HORIBA LTD 发明人 YAMAGUCHI TETSUJI
分类号 G01N21/27;G01N21/35;(IPC1-7):G01N21/27 主分类号 G01N21/27
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