发明名称 Sense amplifier control circuit of semiconductor memory device
摘要 The present invention relates to a semiconductor memory device having a sense amplifier operated by a given control signal and a sense amplifier driver. A comparator compares the amplified sense amplifier driver with a reference voltage. A comparison output signal is enabled and used by a bias circuit and a sense amplifier driver control circuit, which circuit has an output line connected to a control terminal of the sense amplifier driver. The output line signal variably controls current flowing into the sense amplifier driver by allowing the amount of current to be increased when transmitting data from a RAM port to a SAM port. A bias circuit maintains the current flowing into the driving element at a constant state regardless of an increment or decrement of an external power supply voltage.
申请公布号 US5594695(A) 申请公布日期 1997.01.14
申请号 US19950552935 申请日期 1995.11.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YIM, SUNG-MIN;LEE, JUNG-HYUCK
分类号 G11C11/407;G11C7/06;G11C7/22;G11C11/4091;(IPC1-7):G11C7/00 主分类号 G11C11/407
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