发明名称 Mask manufacturing method and apparatus and device manufacturing method using a mask manufactured by the method or apparatus
摘要 A mask manufacturing method includes holding through a first stage a master reticle having a pattern, holding through a second stage a mask substrate, projecting an exposure beam to the pattern of the master reticle held by the first stage, and projecting the pattern onto the mask substrate held by the second stage at a predetermined reduction magnification, and scanning the first and second stages in a timed relation and at a predetermined speed ratio, whereby the pattern of the master reticle is transferred to the mask substrate.
申请公布号 US5593800(A) 申请公布日期 1997.01.14
申请号 US19950367856 申请日期 1995.01.03
申请人 CANON KABUSHIKI KAISHA 发明人 FUJIOKA, HIDEHIKO;NOSE, NORIYUKI;EBINUMA, RYUICHI;HARA, SHINICHI;MAEHARA, HIROSHI
分类号 G03F1/14;G03F7/20;(IPC1-7):G03F9/00 主分类号 G03F1/14
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