Testing a sequential circuit

摘要

A method for testing a sequential circuit by applying a number of test vectors to the primary inputs of the sequential circuit between each application of a clock circuit. Once the sequential circuit enters a state and that state is a necessary condition for detecting various faults, test vectors are applied to the primary inputs of the sequential circuit, which vectors are designed to propagate all fault effects that can be propagated at that state of the circuit. Once those vectors have been applied, a state-advancing vector is applied immediately before the application of the clock. The state-advancing vector is designed to condition the circuit to allow more fault effects to be propagated to the primary outputs, and to propagate fault effects into the storage elements of the circuit.