发明名称 |
Apparatus and method for inspecting a crystal |
摘要 |
An apparatus for inspecting single crystal specimens comprises an x-ray generator which supplies x-rays to a collimator. The collimator has a matrix of apertures to produce a plurality of parallel x-ray beams which are directed onto a surface of the specimen. An x-ray detector detects the x-ray beams diffracted from the surface of the specimen, corresponding to each of the parallel x-ray beams. At each symmetry pole of an overall Laue pattern an accurately predictable pattern of spots is produced on the x-ray detector, if the orientation and shape of the specimen crystal is known. Each spot corresponds to where one of the diffracted beams strikes the detector. A disarrangement of one or more of the spots indicates a difference in crystal orientation.
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申请公布号 |
US5588034(A) |
申请公布日期 |
1996.12.24 |
申请号 |
US19950426602 |
申请日期 |
1995.04.21 |
申请人 |
ROLLS-ROYCE PLC;UNIVERSITY OF WARWICK |
发明人 |
BOWEN, DAVID K.;THOMAS, CHARLES R. |
分类号 |
G01N23/20;(IPC1-7):G01N23/207 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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