METHOD FOR MANUFACTURING SAMPLE FOR ANALYZING MULTI-LAYER SILICON THIN FILM WITH TRANSPARENT ELECTRON MICROSCOPE,申请号KR1019930012390-传众专利搜索

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发明名称	METHOD FOR MANUFACTURING SAMPLE FOR ANALYZING MULTI-LAYER SILICON THIN FILM WITH TRANSPARENT ELECTRON MICROSCOPE
摘要
申请公布号	KR1019960016711(B1)	申请公布日期	1996.12.20
申请号	KR1019930012390	申请日期	1993.07.02
申请人		发明人
分类号		主分类号
代理机构		代理人
主权项
地址

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