发明名称 |
Vertical trench gate MOS device and a method of fabricating the same |
摘要 |
<p>A low-voltage high-current discrete vertical insulated-gate field-effect transistor is made by a process using two silicon etch steps. The gate elctrode (122) is formed in a trench (118) and controls the current in the channel region along the trench sidewalls in an epi layer (101). The source diffusion (128') is provided by an unmasked implant which is screened only by various grown oxides.</p> |
申请公布号 |
EP0747967(A2) |
申请公布日期 |
1996.12.11 |
申请号 |
EP19960303213 |
申请日期 |
1996.05.08 |
申请人 |
STMICROELECTRONICS, INC. |
发明人 |
BLANCHARD, RICHARD A. |
分类号 |
H01L21/336;H01L29/10;H01L29/45;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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