发明名称 Semiconductor trench capacitor cell having a buried strap
摘要 A semiconductor trench capacitor structure having a first level aligned isolation structure and buried strap that extends from within the trench into the doped semiconductor substrate. The semiconductor trench capacitor structure may be fabricated by forming a shallow trench within the trench capacitor and semiconductor substrate, depositing a layer of conductive material within the shallow trench, using a mask to define and recess the strap and depositing insulating material within the shallow trench.
申请公布号 US5576566(A) 申请公布日期 1996.11.19
申请号 US19950421714 申请日期 1995.04.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 KENNEY, DONALD M.
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/04
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