发明名称 |
PHOTORESIST PATTERN FORMING METHOD |
摘要 |
The method is designed to form a positive photoresist pattern of good quality to increase the selectivity of a resist. The method comprises the steps of : forming a photoresist layer(2) by depositing a photoresist material(AZ5214) on a substrate(11); exposing the photoresist layer(2); developing to remove the photoresist layer(2); soaking in alkali solution for the inside of the developed photoresist pattern to cause cross-linking; and hard-baking of the photoresist pattern(2).
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申请公布号 |
KR960015640(B1) |
申请公布日期 |
1996.11.18 |
申请号 |
KR19930012643 |
申请日期 |
1993.07.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
JUNG, HUN-PIL |
分类号 |
G03F7/00;(IPC1-7):G03F7/00 |
主分类号 |
G03F7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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