发明名称 PHOTORESIST PATTERN FORMING METHOD
摘要 The method is designed to form a positive photoresist pattern of good quality to increase the selectivity of a resist. The method comprises the steps of : forming a photoresist layer(2) by depositing a photoresist material(AZ5214) on a substrate(11); exposing the photoresist layer(2); developing to remove the photoresist layer(2); soaking in alkali solution for the inside of the developed photoresist pattern to cause cross-linking; and hard-baking of the photoresist pattern(2).
申请公布号 KR960015640(B1) 申请公布日期 1996.11.18
申请号 KR19930012643 申请日期 1993.07.06
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 JUNG, HUN-PIL
分类号 G03F7/00;(IPC1-7):G03F7/00 主分类号 G03F7/00
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