发明名称 Method of polishing wafers, a backing pad used therein, and method of making the backing pad
摘要 A template-type wafer polishing method in which a plurality of wafers are polished while they are fitted in the corresponding number of circumferentially spaced engagement holes in a template blank, with the backsides of the respective wafers held by a backing pad, wherein the backing pad has, in its one surface next to the template blank, a plurality of annular grooves each extending along a corresponding one of the engagement grooves in the template blank for relieving a stress concentrated on the peripheral edge of each wafer. The polished wafer is free from deformation, such as declination caused at the peripheral edge thereof due to stress concentration and, hence, has an extremely high degree of flatness. The backing pad and a method of making the same are also disclosed.
申请公布号 US5573448(A) 申请公布日期 1996.11.12
申请号 US19940292248 申请日期 1994.08.18
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 NAKAZIMA, YUKIO;KUROYANAGI, ITSUO
分类号 B24B1/00;B24B37/04;B24B37/30;H01L21/304;H01L21/683;(IPC1-7):B24B37/04 主分类号 B24B1/00
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