发明名称 INSPECTION APPARATUS FOR COLOR SAMPLE
摘要 <p>PURPOSE: To provide an inspection apparatus by which the kind of a flaw can be discriminated. CONSTITUTION: The apparatus inspects the flaw of a color sample in which a pattern-shaped colored pixel has been formed out of one or more colors of coloring materials. The apparatus is constituted so as to be provided with one or more cameras 31, 32, for detection, which are arranged on a color sample CF as an object to be inspected and which detect the state of the color sample CF, a plurality of light-source parts La, Lb, Lc, Ta, Tb, Tc which are changed over and used to irradiate the color sample CF in different directions an image processing part which processes image data from the cameras 31, 32 for detection so as to discriminate whether there are flows or not. When the light source parts are changed over to inspect the flaw, the flaws can be discriminated by kind because the kind of a flaw which can be detected by irradiation with each light source differs from each other. Consequently, a product can be processed so as to correspond to the kind of the flaw.</p>
申请公布号 JPH08297070(A) 申请公布日期 1996.11.12
申请号 JP19950102206 申请日期 1995.04.26
申请人 DAINIPPON PRINTING CO LTD 发明人 NAKANISHI MINORU;SHIMIZU SATOSHI
分类号 G01M11/00;G02B5/20;G02F1/1335 主分类号 G01M11/00
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