| 摘要 |
PURPOSE: To reduce measuring points and attain execution of calibration in smaller manhours by executing calibration of a light projecting means and an image pickup means summarizedly, while picking up a laser beam by the image pickup means having sensitivity to the wavelength of the laser beam. CONSTITUTION: This is a calibration method of an article detecting device which calibrates an image pickup characteristic of an image pickup means 7 against a light projecting means 6 in the article detecting device detecting the position of an article 9, by the light projecting means 6 projecting a slit-like laser beam 8 and the image pickup means 7 detecting the light projection form on the surface 9a of the article 9 by light projection from the light projecting means 6. At least over four points P1-P4 of picture element values in the image pickup means 7 of which the absolute positions in the three-dimensional coordinates system in the plane of the slit light 8 are recognized, are detected, and hence the image pickup characteristic of the image pickup means 7 is calibrated. |
