发明名称 NAND TYPE NONVOLATILE MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a non-volatile semiconductor memory device, especially a NAND-type storage that is ideal for high integration. SOLUTION: An ion injection region 60 for increasing a cell current is formed only at the source and drain regions of a depletion-type transistor for string selection and the junction depth of the source and the drain of the depletion-type transistor for selecting a string is formed so that it is deeper than that of the source and the drain of other transistors, thus improving the current driving capability of a memory element.
申请公布号 JPH08288409(A) 申请公布日期 1996.11.01
申请号 JP19960041290 申请日期 1996.02.28
申请人 SAMSUNG ELECTRON CO LTD 发明人 SAI MASATATSU;ZEN SEIFU;KIN HEITETSU
分类号 H01L21/8247;G11C17/00;H01L21/8246;H01L27/112;H01L29/788;H01L29/792 主分类号 H01L21/8247
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