发明名称 Delta-T measurement circuit
摘要 <p>A method and apparatus for measuring very short time periods, or differences between two events, such as the delta-T between a trigger point on a waveform and a sampling clock edge of a digital oscilloscope. The delta-T measurements are made using the time-to-voltage transformation of an integrator. The output sweep ramp of the integrator is normalized to a fixed differential time and differential amplitude by correction current provided by a reference circuit that has a reference integrator substantially identical to the delta-T integrator. The reference integrator is operated at the same timing as the delta-T integrator, and an error correction loop furnishes the right amount of current to both integrators to normalize the peak voltage of both to a predetermined reference voltage. &lt;IMAGE&gt;</p>
申请公布号 EP0740234(A2) 申请公布日期 1996.10.30
申请号 EP19960302531 申请日期 1996.04.10
申请人 FLUKE CORPORATION 发明人 KLATSER, PAUL
分类号 G04F10/10;(IPC1-7):G04F10/10 主分类号 G04F10/10
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