| 摘要 |
<p>An automatic parallel electronic component testing method wherein identical pins (i; i+1) of said components exchange test signals with at least one common test circuit (20; 20') which comprises time generators (22a, 22b, 22c, 22d; 22'a, 22'b, 22'c, 22'd) controlled by a test programming memory (10), as well as power circuits (241, 242; 24'1, 24'2) and comparator circuits (261, 262; 26'1, 26'2) controlled by said time generators. All the time generators are connected to said power circuits or said comparator circuits in such a way that synchronous test signals are obtained on said identical pins (i) of said electronic components. The method is useful for automatic parallel component testing.</p> |
