发明名称 NONVOLATILE SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PURPOSE: To obtain a nonvolatile semiconductor device which exhibits excellent transistor characteristics and can shorten its TAT, by providing a large number of MOS memory transistors in it, and by recording informations in it through varying the impurity concentrations of their gate electrodes. CONSTITUTION: In a nonvolatile semiconductor device, a large number of first conduction type MOS memory transistors each of which has a semiconductor substrate 11 whereon a source region 12 and a drain region 13 are formed and has a gate electrode 15, 16 formed on the semiconductor substrate 11 via a gate insulation film 14 are provided. By varying the impurity concentration of the gate electrode 15, a piece of information is stored in the MOS memory transistor. For example, the gate electrode is configured out of a polycide film comprising a polysilicon film 15 and a metallic silicide film 16. Further, using a mask including ON information and OFF information, boron ions are implanted only into the n<-> -doped polysilicon film 15 of an nMOS memory transistor to be brought into OFF state.
申请公布号 JPH08274192(A) 申请公布日期 1996.10.18
申请号 JP19950074938 申请日期 1995.03.31
申请人 NKK CORP 发明人 TAKEUCHI NOBUYOSHI
分类号 H01L29/78;H01L21/8246;H01L27/112 主分类号 H01L29/78
代理机构 代理人
主权项
地址