| 摘要 |
For protecting the gate insulating layer of an insulated gate field-effect transistor from electrostatic charges, the main terminals of a depletion mode (normally conducting) field-effect transistor, serving as a protection transistor, are connected between the gate and source terminals of the transistor to be protected, thus providing a shunt path for electrostatic charges when the protection transistor is not biased out of conduction. For normal operation, the protection transistor is biased out of conduction by applying to its gate terminal the voltage drop across a biasing resistor in series with the source terminal of the insulated gate field-effect transistor. This protection arrangement is particularly advantageous for silicon carbide field-effect transistors which are not readily suited to application of conventional (i.e. silicon transistor) gate insulating layer protection techniques.
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