发明名称 Plasma reactor with a segmented balanced electrode for sputtering process materials from a target surface
摘要 A plasma reactor for processing a semiconductor substrate within a reactor chamber with a process gas from which a plasma has been formed in the chamber by electromagnetic excitation includes a sputter target in the chamber and overlying the wafer, the sputter target having additive material for the plasma, and a sputter excitation electrode overlying the target surface, the sputter excitation electrode having plural conductive segments separated by apertures therebetween, selected ones of the plural conductive segments being excited by an RF signal of a given phase and other of said plural conductive segments being excited by an RF signal of a different phase. Preferably, alternate segments are excited by RF signals of opposite phase, so that RF power radiated by alternate ones of the conductive segments is balanced by the RF power radiated by the remaining ones of the conductive segments. Preferably, segments excited by one phase are insulated from segments excited by the other phase.
申请公布号 US5565074(A) 申请公布日期 1996.10.15
申请号 US19950508118 申请日期 1995.07.27
申请人 APPLIED MATERIALS, INC. 发明人 QIAN, XUE Y.;SATO, ARTHUR H.
分类号 C23F4/00;H01J37/32;H01J37/34;H01L21/203;H01L21/302;H01L21/3065;H01L21/3213;(IPC1-7):C23C14/34 主分类号 C23F4/00
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