| 摘要 |
A method of testing a plurality of semi-conductor devices simultaneously in which the devices are placed in a testing station, at which point each device is tested and the information is stored in a memory unit, the devices then being moved to a control station, and while a second set of devices are being tested at the testing station, the memory unit operating so that an observer sees at the control station a spot of light for each faulty device, so that the faulty devices can be readily marked.
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