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发明名称
SEMICONDUCTOR STORAGE DEVICE HAVING DATA-COMPRESSION TEST FUNCTION AND TESTING METHOD THEREOF
摘要
申请公布号
JPH08255499(A)
申请公布日期
1996.10.01
申请号
JP19950056370
申请日期
1995.03.15
申请人
FUJITSU LTD
发明人
UCHIDA TOSHIYA
分类号
G06F12/16;G11C11/401;G11C29/26;G11C29/34;G11C29/40;(IPC1-7):G11C29/00
主分类号
G06F12/16
代理机构
代理人
主权项
地址
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