发明名称 Semiconductor platelet on support precise location method
摘要 The method involves high precision locating of a platelet having dimensions in mm and sub-mm region. The platelet is of the GaAs or Si material and contains a first top side structure for a microelectronic, electric, or micromechanical function. The platelet is provided with a second structuring of depressions and/or apertures and/or recesses. The support structure contains rising formations. The platelet is so deposited on the support that the latter rising formations are inserted into the platelet depressions. Pref. the platelet second structuring is adapted to the first one.
申请公布号 DE19510003(A1) 申请公布日期 1996.09.26
申请号 DE19951010003 申请日期 1995.03.22
申请人 INSTITUT FUER MIKROTECHNIK MAINZ GMBH, 55129 MAINZ, DE 发明人 HAINEL, FRANK, DR.-ING., 10319 BERLIN, DE;WOLF, ANDREJ, DIPL.-ING., 01259 DRESDEN, DE;KAEMPER, KLAUS-PETER, DR., 55278 MOMMENHEIM, DE;MICHEL, FRANK, DR.-ING., 55268 NIEDER-OLM, DE
分类号 H01L21/58;H01L29/06;(IPC1-7):H01L21/58;H01L23/13 主分类号 H01L21/58
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