发明名称 |
Method of and system for measurement of direction of surface and refractive index variations using interference fringes |
摘要 |
A main measuring light having a first wavelength is projected onto a work and a reference surface to produce first interference fringes and a determination light having a second wavelength slightly different from the first wavelength is projected onto the work and the reference surface to produce second interference fringes. Whether the surface of the work is concave or convex, in which direction the surface inclines or the refractive index distribution of the work is determined on the basis of the relative positions of the first and second interference fringes.
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申请公布号 |
US5557408(A) |
申请公布日期 |
1996.09.17 |
申请号 |
US19950406364 |
申请日期 |
1995.03.17 |
申请人 |
FUJI PHOTO OPTICAL CO., LTD. |
发明人 |
KANAYA, MOTONORI |
分类号 |
G01B9/02;G01B11/24;G06T1/00;(IPC1-7):G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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