| 摘要 |
A method for detecting faults on a printed circuit board populated with semiconductor electronic components. To detect faults, signal pins on the components are taken in pairs. The an indication of the common mode resistance between those pins and ground is computed from a series of current measurements. An error is detected when the common mode resistance is outside of a predetermined range. A "learn mode" is also disclosed in which the pairs of leads used for the test are selected by taking measurements on a known good board without detailed knowledge of the semiconductor components on the board.
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