发明名称 SEMICONDUCTOR DEVICE ISOLATION METHOD
摘要 The method of isolating semiconductor device comprises the steps of : forming a buffer layer(24) on a semiconductor substrate(20); forming an oxidation-preventive pattern(26) having an open to reveal some of the buffer layer(24) and defining an isolation region on the buffer region(24); forming an undercutting region(27) by etching the revealed buffer layer(24) isotropically; forming an oxidation-preventive spacer(28) burying the undercutting region(27); forming a field oxide film(30) by oxidizing the exposed buffer layer(24) and the surface of the substrate.
申请公布号 KR960011861(B1) 申请公布日期 1996.09.03
申请号 KR19930010568 申请日期 1993.06.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YANG, WON - SUK;HWANG, MIN - WOOK;HWANG, CHANG - KYU
分类号 H01L21/32;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/32
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