发明名称 |
SEMICONDUCTOR DEVICE ISOLATION METHOD |
摘要 |
The method of isolating semiconductor device comprises the steps of : forming a buffer layer(24) on a semiconductor substrate(20); forming an oxidation-preventive pattern(26) having an open to reveal some of the buffer layer(24) and defining an isolation region on the buffer region(24); forming an undercutting region(27) by etching the revealed buffer layer(24) isotropically; forming an oxidation-preventive spacer(28) burying the undercutting region(27); forming a field oxide film(30) by oxidizing the exposed buffer layer(24) and the surface of the substrate.
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申请公布号 |
KR960011861(B1) |
申请公布日期 |
1996.09.03 |
申请号 |
KR19930010568 |
申请日期 |
1993.06.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YANG, WON - SUK;HWANG, MIN - WOOK;HWANG, CHANG - KYU |
分类号 |
H01L21/32;H01L21/762;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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