发明名称 FUNCTION TESTING METHOD FOR FRAME CONVERTER AND FUNCTION TESTING DEVICE FOR FRAME CONVERTER
摘要 PURPOSE: To shorten operation time and to improve accuracy by automatically generating the three kinds of the data of synchronous frame STM/asynchronous ATM cells and the conversion setting data of STM frames/ATM cell strings from the same file and automating a collation processing. CONSTITUTION: In a conversion setting data generation processing, required setting contents are written in an STM setting chart 1001 and stored in a memory 100 for respective time slots in response to the testing items of a device 600 to be tested. Next, an input cell order file 1003 for indicating the input order of cells and an input frame attribute file 1002 for indicating the attributes of use or non-use in the conversion of the time slots are prepared and respectively stored in the memories 1003 and 1002. Then, the respective generation processings of the conversion setting data, the STM frames and the ATM cells are applied, test data are generated and a test by the device 600 to be tested is executed. After the files 1007 and 1008 of the results are stored in the memory 100, an inspection and collation processing is performed in the output collation parts 205 and 206 of ATM and STM and a test result is judged.
申请公布号 JPH08223164(A) 申请公布日期 1996.08.30
申请号 JP19950020813 申请日期 1995.02.08
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 AOKI TAKASHI;ISHIKAWA KEIJI
分类号 G06F11/22;H04J3/00;H04J3/14;H04L12/26;H04L12/28;H04L12/70;H04Q3/00 主分类号 G06F11/22
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