发明名称 PRODUCTION DEVICE FOR LOGIC CIRCUIT TEST PATTERN
摘要 PURPOSE: To confirm the correct HDL description of a logic simulation test pattern without carrying out the logic simulation. CONSTITUTION: An HDL reading part 11 reads a logic simulation test pattern A which is described in an HDL. A time series data conversion part 12 analyzes the procedure included in the HDL and converts the pattern A described in the HDL into the time series data B. Then a time series data display part 13 shows the data B in a graphic and in the text value.
申请公布号 JPH08221472(A) 申请公布日期 1996.08.30
申请号 JP19950050530 申请日期 1995.02.15
申请人 RICOH CO LTD 发明人 MUROTA TOSHIYA;NISHIGAKI NAOHIKO
分类号 G06F11/22;G06F17/50 主分类号 G06F11/22
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