发明名称 |
PATTERNING METHOD USING PHASE SHIFT MASK |
摘要 |
The method of forming pattern using half-phase shift mask comprises the steps of : exposing with a half-phase shift mask(30) after forming a photoresist film(9) on the semiconductor substrate(10); flattening the part(8) exposed by the unnecessary energy of the photoresist film(9) by etching; and forming a pattern through a by developing process.
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申请公布号 |
KR960011460(B1) |
申请公布日期 |
1996.08.22 |
申请号 |
KR19930010707 |
申请日期 |
1993.06.12 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
HAM, YOUNG - MOK |
分类号 |
H01L21/30;(IPC1-7):H01L21/30 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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