发明名称 PATTERNING METHOD USING PHASE SHIFT MASK
摘要 The method of forming pattern using half-phase shift mask comprises the steps of : exposing with a half-phase shift mask(30) after forming a photoresist film(9) on the semiconductor substrate(10); flattening the part(8) exposed by the unnecessary energy of the photoresist film(9) by etching; and forming a pattern through a by developing process.
申请公布号 KR960011460(B1) 申请公布日期 1996.08.22
申请号 KR19930010707 申请日期 1993.06.12
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 HAM, YOUNG - MOK
分类号 H01L21/30;(IPC1-7):H01L21/30 主分类号 H01L21/30
代理机构 代理人
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