发明名称 |
Post hot working process for semiconductors |
摘要 |
A post-hot metal deposition process applied to semiconductor wafer manufacturing in order to increase the size of grain structures and improve electromigration resistance in semiconductor devices. A highly ductile metal is first deposited onto a semiconductor substrate having contact points in a partial vacuum. A forge is applied to the substrate-with the highly ductile metal deposited thereon, to form a smooth conductive surface on the substrate, even at the contact points. The forging is done at an appropriate pressure and temperature to perform hot-working of the metal onto the contact points of the substrate. The forge may be used to emboss a conductor image of the highly ductile metal deposited on the substrate. The forging process may be performed by either stamping a surface onto the substrate or by rolling a surface onto the substrate.
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申请公布号 |
US5547902(A) |
申请公布日期 |
1996.08.20 |
申请号 |
US19950375414 |
申请日期 |
1995.01.18 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
ROHNER, DON |
分类号 |
H01L21/768;(IPC1-7):H01L21/44 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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