发明名称 Post hot working process for semiconductors
摘要 A post-hot metal deposition process applied to semiconductor wafer manufacturing in order to increase the size of grain structures and improve electromigration resistance in semiconductor devices. A highly ductile metal is first deposited onto a semiconductor substrate having contact points in a partial vacuum. A forge is applied to the substrate-with the highly ductile metal deposited thereon, to form a smooth conductive surface on the substrate, even at the contact points. The forging is done at an appropriate pressure and temperature to perform hot-working of the metal onto the contact points of the substrate. The forge may be used to emboss a conductor image of the highly ductile metal deposited on the substrate. The forging process may be performed by either stamping a surface onto the substrate or by rolling a surface onto the substrate.
申请公布号 US5547902(A) 申请公布日期 1996.08.20
申请号 US19950375414 申请日期 1995.01.18
申请人 ADVANCED MICRO DEVICES, INC. 发明人 ROHNER, DON
分类号 H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/768
代理机构 代理人
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