发明名称 Method of producing semiconductor device and photomask therefor
摘要 In a wafer process of a semiconductor device, disclosed are photomasks and a semiconductor device producing method. In forming a plurality of semiconductor chips on a semiconductor substrate by using a plurality of photomasks, at least one photomask 10 having an effective chip arrangement composed of a grid-like pattern 80 which does not form chips incomplete in appearance and/or in function in an outer circumferential range of a wafer 3 is used in the exposure step.
申请公布号 US5545498(A) 申请公布日期 1996.08.13
申请号 US19950380060 申请日期 1995.01.30
申请人 SEIKO EPSON CORPORATION 发明人 KONNO, TSUGIMI
分类号 G03F1/14;G03F7/20;(IPC1-7):G03F9/00 主分类号 G03F1/14
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