发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE: To suppress deterioration of a word line in the case where a supply voltage is high or at the time of a BT test, and thereby to ensure reliability, by boosting the voltage of the word line within the supply voltage when the supply voltage is a prescribed value or below, and by outputting the supply voltage when it exceeds the prescribed value. CONSTITUTION: A supply voltage detecting circuit 101, a boosting circuit 102 and a power supply selecting circuit 103 are provided and the boosting circuit 102 is controlled by a detection signal ϕ1 of the supply voltage detecting circuit 101. In the case where a supply voltage value exceeds a prescribed value, this supply voltage value is outputted, and when the supply voltage value is the prescribed value or below, a boosted voltage is outputted.
申请公布号 JPH08203281(A) 申请公布日期 1996.08.09
申请号 JP19950013156 申请日期 1995.01.30
申请人 NEC CORP 发明人 HASEO EIJI
分类号 G11C11/407;G11C5/14;G11C11/413;H01L21/822;H01L21/8244;H01L27/04;H01L27/10;H01L27/105;H01L27/11 主分类号 G11C11/407
代理机构 代理人
主权项
地址