发明名称 MULTIPLE TIER COLLIMATOR SYSTEM FOR ENHANCED STEP COVERAGE AND UNIFORMITY
摘要 A collimator system for use in PVD sputtering of semiconductor wafers having multiple tiers provided between a target and wafer substrate. The collimator system prevents target atoms from contacting the wafer at substantially oblique angles, thereby providing good step coverage uniformity over the surface of the wafer. Additionally, the presence of more than one tier prevents localized build-up of target atoms that occurs in conventional single tier collimators, thereby providing good flat coverage uniformity over the surface of the wafer.
申请公布号 WO9624155(A1) 申请公布日期 1996.08.08
申请号 WO1996US00572 申请日期 1996.01.11
申请人 ADVANCED MICRO DEVICES, INC. 发明人 KRIVOKAPIC, ZORAN;BANG, DAVID, S.
分类号 H01J37/34;(IPC1-7):H01J37/34 主分类号 H01J37/34
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