发明名称 Apparatus and method for semiconductor substrate processing
摘要 <p>A semiconductor processing apparatus and process is disclosed which is capable of degassing a semiconductor substrate (30) and also orienting the substrate (30) in the same vacuum chamber (2). The apparatus includes an electrostatic clamping structure (10,12,20) for retaining the entire undersurface of a semiconductor substrate (30) in thermal communication therewith in the vacuum chamber (2), a heater (14) located within the electrostatic clamping structure (10,12,20) for heating the electrostatically clamped substrate (30) to degas it, a rotation mechanism (40,42,44) for imparting rotation to the substrate in the vacuum chamber (2), and a detector (80) for detecting the rotational alignment of the substrate (30) in response to the rotation of the substrate (30). In a preferred embodiment, the substrate (30) is rotated to rotationally align it as it is being heated to degas it. &lt;IMAGE&gt;</p>
申请公布号 EP0725427(A2) 申请公布日期 1996.08.07
申请号 EP19960101602 申请日期 1996.02.05
申请人 APPLIED MATERIALS, INC. 发明人 DAVENPORT, DAVID E.
分类号 C23C14/50;H01L21/00;H01L21/203;H01L21/683;(IPC1-7):H01L21/00 主分类号 C23C14/50
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