发明名称 |
Nonvolatile semiconductor memory having program verifying circuit |
摘要 |
A nonvolatile semiconductor memory device according to the present invention includes an array of cell units, each cell unit including at least one memory transistor which has a floating gate and a control gate, the array being divided into a plurality of memory blocks each having a certain number of cell units. The nonvolatile semiconductor memory device operates in a program mode, a program verify mode and a read mode. A current source provides a predetermined electrical current to the bit lines during both data reading and programming modes, and a common data latch stores program data during a write operation, as well as senses and stores data when the nonvolatile memory device is operated in a data read mode and a program verify mode.
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申请公布号 |
US5541879(A) |
申请公布日期 |
1996.07.30 |
申请号 |
US19950441476 |
申请日期 |
1995.05.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SUH, KANG D.;KIM, JIN K.;CHOI, JEONG H. |
分类号 |
G11C16/04;G11C16/02;G11C16/06;G11C16/12;G11C16/16;G11C17/00;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C7/00 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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