| 摘要 |
PROBLEM TO BE SOLVED: To provide a malfunction detecting circuit which can detect occurrence of duplication or loss of data at respective timing when data are read out from a FIFO memory. SOLUTION: A test data generating circuit 12 generates test data increasing one by one whenever write-in indication is issued from a write-in circuit 11, A FIFO memory 13 stores the generated test data and write-in data. Whenever read-out indication is issued from a read-out circuit 14, a verification data generating circuit 15 generates verification data increasing one by one, a comparator circuit obtains test data stored in the FIFO memory 13 and the generated verification data and compares them, when the both do not coincide, the circuit outputs a malfunction detecting signal. |
