PROBE FOR ELECTRIC FIELD MEASUREMENT AND MANUFACTURE

摘要

PURPOSE: To enhance productivity of a probe for electric field measurement and to lengthen longevity of it. CONSTITUTION: An electro-optic crystal chip 1 with a protruded part 1a which is square, some 10μm on each side and about 10μm high formed on its central part is fixed on a head end of a support body 3 made of quartz, etc. A reflective film 2 consisting of a dielectric body multilayer film is formed on a surface of the electro-optic crystal chip 1. A composition plane of the electro-optic crystal chip 1 and the support body 3 is about 1mm or more in size on a probe for electric field measurement constituted as above.