| 摘要 |
FIELD: generation of test data combinations for integrated circuits. ^ SUBSTANCE: integrated CDMA circuit includes a demodulator for correlating input data with one of the set of codes and generator of test data combinations for expanding input test data with one of a set of codes to generate expanded text data and to provide expanded text data to demodulator. The set of codes may be combined with input text data to generate a set of expanded text data, which are then sent to various components of CDMA microchip to test various components. In one variant, each code from a set of codes contains a scrambling code and an expanding code. ^ EFFECT: increased efficiency. ^ 3 cl, 3 dwg |
